Instruments list

  • Clean room (1F) Class 1000

  • Planetary sample handling room (PSH)
    • Clean chamber 1 for sample catcher opening (atmosphere controlled) : (Hitachi, [image])
    • Clean chamber 2 for sample handling (atmosphere controlled) : (Miwa, [image])
    • N2 desiccators for devise storage (PSH-1, -2, -3, -4, -5, -6) (atmosphere controlled)
    • Clean bench : (Airtech Japan, [image])
    • Transportable vacuum system : (Osaka Vacuum, [image])
    • Microbalance : (Mettler Toledo, [image])
    • Notice: All instruments in this room are not available other than members of ASRG

  • Planetary sample handling room 2 (PSH2)
    • Clean chamber 3-1, 3-2 for sample catcher opening and sample handling in vacuum (atmosphere controlled) : (Toyama)
    • Clean chamber 3-3, 4-1, 4-2 for sample handling (atmosphere controlled) : (Miwa)
    • Transportable vacuum system : (Osaka Vacuum, [image1] [image2])
    • Notice: All instruments in this room are not available other than members of ASRG

  • SEM room (SEM)
    • Field emission scanning electron microscope / Energy dispersive x-ray spectroscopy system (atmosphere controlled) : S-4300SE/N (Hitachi HT, [image])
    • X-ray diffraction analyzer : RINT Rapid 191R (Rigaku, [image])
    • Micro Fourier transform infrared spectrometer : IRT-5000 + FT/IR 6100 (JASCO, [image])
    • Micro Raman spectrometer : NRS-5100 (JASCO, [image])
    • Optical microscope for sample handling : Eclipse LV100 (Nikon, [image])
    • Stereo microscope for probe preparation : SMZ-1500 (Nikon, [image])
    • Universal measuring microscope : MM-400 (Nikon, [image])
    • Glovebox for sample preparation (glovebox1, atmosphere controlled) : (Miwa, [image])
    • Glovebox for sample storage & packing (glovebox2, atmosphere controlled) : (Sanplatec, [image])
  • Sample preparation room (SP)
    • Acid-alkali cleaning room
    • Clean draft chamber for Acid-alkali cleaning (Airtech Japan, [image])
    • Electronic balance : TX3202N (Shimadzu, [image])
    • Focused ion beam (atmosphere controlled) : FB-2200 (Hitachi HT, [image])
    • Field emission scanning electron microscope / Energy dispersive x-ray spectroscopy system / Electron backscatter diffraction detector (atmosphere controlled) : SU6600 (Hitachi HT, [image])
    • Multi-purpose Zoom Microscope for sample check : AZ100 (Nikon, [image])
    • Ultrapure water generator : (Merck Millipore, [image])
    • N2 desiccators for devise storage(SP-1, -2, -5) (atmosphere controlled)
    • N2 desiccators for sample storage(SP-3, -4) (atmosphere controlled)
  • Clean room (1F) Class 10000

  • Manufacturing and cleaning room (M&C)
    • Organic solvent cleaning room
    • Clean draft chamber for organic solvent cleaning, (Airtech Japan, [image])
    • Vacuum bake furnace, (Ulvac, [image])
    • High temperature oven : DRD360DA (ADVANTEC, [image])
    • Bake furnace : 310NS (ETTAS, [image])
    • UV Ozone Cleaner : Ozone killer (Filgen, [image])
    • Ultrasonic cleaner : HRSD0610 (Chiyoda-electric), PhenixII 38kHz 600, PhenixLegend 38kHz 1200, Quava 950kHz (Kaijo), 2510J-DTH (Branson), [image], [image]
    • Plasma cleaner : Plasmabeam (Diener, [image])
    • Dry-ice blasting cleaner : Quick Snow (Air Water, [image])
    • Clean drying machine : (CREST, [image])
    • Glovebox for sample embedding (Sanplatec, glovebox3, atmosphere controlled)
      Stereo microscope for sample manipulation : SMZ-1500 (Nikon)
      Vacuum drying oven: VM-303D (JEOL)
      [image]
    • Microindenter: HM221 (Mitutoyo, [image])
    • Contact angle meter : DM-300 (Kyowa)
    • Metal holder processing unit : (Nogamigiken, Micro Diamond, [image])
    • Ultramicrotome (atmosphere controlled) : EM UC7 (Leica, [image])
    • Platinum coater (atmosphere controlled) : (Vacuum devise, [image])
    • N2 desiccators for sample storage (HY2-1, -2)
    • N2 desiccators for devise storage (M&C-1, -2, -3, -4)
  • Laboratories (2F)

  • SEM room
    • Scanning electron microscope / Energy dispersive x-ray spectroscopy system : JSM-6510LA (JEOL, [image])
    • Transmission electron microscope / Energy dispersive x-ray spectroscopy system : JEM-1400Plus (JEOL, [image])
    • Clean booth (Class 1000, [image])
    • Optical microscope for sample handling (Nikon, [image])
    • Stereo microscope for sample handling : SMZ-1000 (Nikon, [image])
    • Laser puller : Model P-2000 (Sutter instrument, [image])
    • Laser processing machine : Rayjet (Trotec, [image])
    • Computer numerical controlled milling machine : PSF240 (PRO SPEC, [image])
    • Muffle furnaces : KDF-S70 (Denken-highdental, [image])
  • MS room
    • Focused ion and electron beam system & Triple beam system : NX2000 (Hitachi HT, [image])
    • Isotope-ratio mass spectrometer : DELTA V ADVANTAGE (Thermo, [image])
    • Time of flight mass spectrometer : infiTOF-ISO2 (MSI TOKYO, [image])
    • Ar ion milling : SVM-721 (Sanyu-electron, [image])
    • Magnetron sputtering Au/Pt coater : MSP-1S (Vacuum devise, [image])
    • Carbon coater : VE-2030 (Vacuum devise, [image])
    • Ultrasonic cleaner : 1510J-DTH (Branson, [image])
    • High speed sample milling system for TEM : EM Trim2 (Leica, [image])
    • Resin mixer : Thinky mixer AR-100 (Thinky, [image])
    • Blade saw : Isomet 5000 (Buehler, [image])
    • Blade saw : Isomet (Buehler, [image])
    • Vibratory polisher : VibroMet 2 (Buehler, [image]
    • Lapping machine : MA-200e (Musashino Denshi, [image])
    • Microbalance : XP404S (Mettler Toledo, [image])
    • Electronic balance : TX2202N (Shimadzu, [image])
    • Motorless stellar : ML-101 (Az one, [image])
    • Vacuum drying oven : DP-33 (Yamato, [image])
    • Vacuum drying oven: VM-303D (JEOL, [image])
    • Stereo microscope : SZX12 (Olympus, [image])
    • Polarization microscope : Eclipse LV100POL (Nikon, [image])
    • Labohood+exhaust gas treatment equipment (activated carbon) : LF-600, KT-02 (Azone, [image])
    • Pure water production system (Organo, [image])
    • Vacuum desiccators (Az one, [image])
  • Machine room (B1)

    • Ion gun system : OMI-0050MSCK (Omegatron, [image])
    • Fourier transform infrared spectrometer : Nicolet iS50 (Thermo Fisher Scientific, [image])
    • Drilling machine : TBT13S (Hitachi Koki)
    • Drilling machine : NSD-BR (KIRA, [image])
    • Milling machine : Little Milling 9 (TOYOAS, [image])
    • Diamond saw : VS-33 (LUXO, [image])
    • Grinder : GT15 (Hitachi Koki, [image])
    • Grinder : SGK-C (Showa Denki, [image])
    • Height gauge : HDS (Mitutoyo, [image])
  • Other

    • Image processing server : Precision T7610 (Dell) + K20 & CUDA
    • UV Black light : SC-125 (Eishin, [image])
    • UV Fluorescence photon detection unit : C9692-03 (Hamamatsu, [image])
    • Radiation thermometer
    • Puller : PC-10 (Narishige, [image])
    • High vacuum furnace

Technical information